| Journal Profile | |
| Journal Title | IEEE Design & Test
|
| Journal Title Abbreviations | IEEE DES TEST |
| ISSN | 2168-2356 |
| h-index | 72 |
| CiteScore | | CiteScore | SJR | SNIP | CiteScore Rank |
|---|
| 3.80 | 0.489 | 0.757 | | Subject field | Quartiles | Rank | Percentile | Category: Engineering
Subcategory: Electrical and Electronic Engineering | Q2 | 354 / 797 |
| Category: Engineering
Subcategory: Hardware and Architecture | Q3 | 94 / 177 |
| Category: Engineering
Subcategory: Software | Q3 | 230 / 407 |
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|
|
| Self-Citation Ratio (2020-2021) | 0.00% |
| 期刊简介 | Lorem ipsum dolor sit amet, consectetur adipiscing elit. Sed do eiusmod tempor incididunt ut labore et dolore magna aliqua. Ut enim ad minim veniam, quis nostrud exercitation ullamco laboris nisi ut aliquip ex ea commodo consequat. Duis aute irure dolor in reprehenderit in voluptate velit esse cillum dolore eu fugiat nulla pariatur. Excepteur sint occaecat cupidatat non proident, sunt in culpa qui officia deserunt mollit anim id est laborum. |
| Official Website | https://www.ieee.org/membership-catalog/productdetail/showProductDetailPage.html?product=PER311-EPC |
| Online Manuscript Submission | |
| Open Access | No |
| Publisher | 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141 |
| Subject Area | COMPUTER SCIENCE, HARDWARE & ARCHITECTURE |
| Country/Area of Publication | UNITED STATES |
| Publication Frequency | |
| Year Publication Started | 0 |
| Annual Article Volume | 59 |
| Gold OA文章占比 | |
| OA期刊相关信息 | |
| WOS期刊SCI分区 | |
| Indexing (SCI or SCIE) | Science Citation Index Expanded
|
| Link to PubMed Central (PMC) | https://www.ncbi.nlm.nih.gov/nlmcatalog?term=2168-2356%5BISSN%5D |
| Average Duration of Peer Review * | Authorized Data from Publisher:
Data from Authors: |
| Competitiveness * | Data from Authors: |
| Useful Links | |
| *All review process metrics, such as acceptance rate and review speed, are limited to our user-submitted manuscripts. As such they may not reflect the journals' exact competitiveness or speed. |
