| Journal Profile | |||||||||||||||||||||
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| Journal Title | IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | ||||||||||||||||||||
| Journal Title Abbreviations | IEEE INSTRU MEAS MAG | ||||||||||||||||||||
| ISSN | 1094-6969 | ||||||||||||||||||||
| h-index | 38 | ||||||||||||||||||||
| CiteScore |
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| Self-Citation Ratio (2020-2021) | 17.50% | ||||||||||||||||||||
| 期刊简介 | Lorem ipsum dolor sit amet, consectetur adipiscing elit. Sed do eiusmod tempor incididunt ut labore et dolore magna aliqua. Ut enim ad minim veniam, quis nostrud exercitation ullamco laboris nisi ut aliquip ex ea commodo consequat. Duis aute irure dolor in reprehenderit in voluptate velit esse cillum dolore eu fugiat nulla pariatur. Excepteur sint occaecat cupidatat non proident, sunt in culpa qui officia deserunt mollit anim id est laborum. | ||||||||||||||||||||
| Official Website | http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5289 | ||||||||||||||||||||
| Online Manuscript Submission | https://www.editorialmanager.com/IMM | ||||||||||||||||||||
| Open Access | No | ||||||||||||||||||||
| Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141 | ||||||||||||||||||||
| Subject Area | Engineering | ||||||||||||||||||||
| Country/Area of Publication | UNITED STATES | ||||||||||||||||||||
| Publication Frequency | Quarterly | ||||||||||||||||||||
| Year Publication Started | 1998 | ||||||||||||||||||||
| Annual Article Volume | 64 | ||||||||||||||||||||
| Gold OA文章占比 | |||||||||||||||||||||
| OA期刊相关信息 | |||||||||||||||||||||
| WOS期刊SCI分区 | |||||||||||||||||||||
| Indexing (SCI or SCIE) | Science Citation Index Expanded | ||||||||||||||||||||
| Link to PubMed Central (PMC) | https://www.ncbi.nlm.nih.gov/nlmcatalog?term=1094-6969%5BISSN%5D | ||||||||||||||||||||
| Average Duration of Peer Review * | Authorized Data from Publisher: Data from Authors: >12 Week(s), or Invited contributions | ||||||||||||||||||||
| Competitiveness * | Data from Authors: Easy | ||||||||||||||||||||
| Useful Links |
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| *All review process metrics, such as acceptance rate and review speed, are limited to our user-submitted manuscripts. As such they may not reflect the journals' exact competitiveness or speed. | |||||||||||||||||||||
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| Reviews on IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE: | Write a review |
| Author: jack Subject Area: Information Science Duration of Peer Review: 3.0 month(s) Result: Accepted after revision Write a review |
Reviewed 2017-12-23 14:59:20 2017,February 12 contributionOverhaul on June 11, 2017,Revised on June 22, 2017,Received on August 11, 2017,2017, years, December 4th issue  (0) Thank | jack  |
| Author: Setting me free Subject Area: Engineering Duration of Peer Review: 1.0 month(s) Result: Accepted after revision Write a review |
Reviewed 2025-03-17 16:13:07 Has your article been published? (0) Thank | Setting me free |
| Author: Setting me free Subject Area: Engineering Duration of Peer Review: 1.0 month(s) Result: Accepted after revision Write a review |
Reviewed 2024-12-26 16:33:41 It was submitted on August 26th. (0) Thank | Setting me free |
| Author: Setting me free Subject Area: Engineering Duration of Peer Review: 1.0 month(s) Result: Accepted after revision Write a review |
Reviewed 2024-12-26 16:31:43 Submitted for the first time on September 26, 24. Revised on September 20, 24 (8 revision issues were raised). Submitted after revision on October 2, 24. Accepted on November 5, 24. Overall, the process was relatively quick. (0) Thank | Setting me free |
| Author: Agustinwgq Subject Area: Engineering Duration of Peer Review: 1.0 month(s) Result: Accepted after revision Write a review |
Reviewed 2024-11-19 15:31:12 First submission on August 20, 24. Resubmission on September 2, 24 (too many images, should not exceed 8, hence returned for resubmission). Minor revisions on October 14, 24. Returned on October 18, 24. Accepted on November 4, 24. Overall process was relatively fast, with a focus on industrial applications rather than technical innovation. Feedback was easily addressed. As a flagship magazine of IEEE, some applied work that may be difficult to publish elsewhere has a better chance here. (0) Thank | Agustinwgq |
| Author: Anonymous Subject Area: Duration of Peer Review: 0.0 month(s) Result: Write a review |
Reviewed 2011-08-19 09:39:00 Journal Homepage URL: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=5289 (0) Thank | Anonymous |
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